Background calibration of non-linearity of samplers and amplifiers in ADCs

ABSTRACT

Analog circuits are often non-linear, and the non-linearities can hurt performance. Designers would trade off power consumption to achieve better linearity. An efficient and effective calibration technique can address the non-linearities and reduce the overall power consumption. A dither signal injected to the analog circuit can be used to expose the non-linear behavior in the digital domain. To detect the non-linearities, a counting approach is applied to isolate non-linearities independent of the input distribution. The approach is superior to and different from other approaches in many ways.

PRIORITY DATA

This patent application claims priority to and receives benefit of U.S.Provisional Patent Application Ser. No. 62/625,636, titled “BACKGROUNDCALIBRATION OF NON-LINEARITY OF SAMPLERS AND AMPLIFIERS IN ADCS”, filedon Feb. 2, 2018, which is hereby incorporated in its entirety.

TECHNICAL FIELD OF THE DISCLOSURE

The present disclosure relates to the field of integrated circuits, inparticular to background calibration of analog-to-digital converters(ADCs).

BACKGROUND

In many electronics applications, an analog-to-digital converter (ADC)converts an analog input signal to a digital output signal, e.g., forfurther digital signal processing or storage by digital electronics.Broadly speaking, ADCs can translate analog electrical signalsrepresenting real-world phenomenon, e.g., light, sound, temperature,electromagnetic waves, or pressure for data processing purposes. Forinstance, in measurement systems, a sensor makes measurements andgenerates an analog signal. The analog signal would then be provided toan ADC as input to generate a digital output signal for furtherprocessing. In another instance, a transmitter generates an analogsignal using electromagnetic waves to carry information in the air or atransmitter transmits an analog signal to carry information over acable. The analog signal is then provided as input to an ADC at areceiver to generate a digital output signal, e.g., for furtherprocessing by digital electronics.

Due to their wide applicability in many applications, ADCs can be foundin places such as broadband communication systems, audio systems,receiver systems, etc. Designing circuitry in ADC is a non-trivial taskbecause each application may have different needs in performance, power,cost, and size. ADCs are used in a broad range of applications includingCommunications, Energy, Healthcare, Instrumentation and Measurement,Motor and Power Control, Industrial Automation and Aerospace/Defense. Asthe applications needing ADCs grow, the need for fast yet accurateconversion also grows.

BRIEF DESCRIPTION OF THE DRAWINGS

To provide a more complete understanding of the present disclosure andfeatures and advantages thereof, reference is made to the followingdescription, taken in conjunction with the accompanying figures, whereinlike reference numerals represent like parts, in which:

FIG. 1 illustrates injection and removal of dither for a non-linearsystem, according to some embodiments of the disclosure;

FIG. 2 shows a transfer characteristic of a second order non-linearity,according to some embodiments of the disclosure;

FIG. 3 shows a transfer characteristic of a third order non-linearity,according to some embodiments of the disclosure;

FIG. 4 illustrates input to output relationships of a linear system anda system in the presence of a third order non-linearity, according tosome embodiments of the disclosure;

FIG. 5 shows a difference between the actual output and the expectedoutput in the presence of the third order non-linearity, according tosome embodiments of the disclosure;

FIG. 6 illustrates input to output relationships of a linear system anda system in the presence of a second order non-linearity, according tosome embodiments of the disclosure;

FIG. 7 shows the difference in the outputs (e.g., y₂−y₁) before andafter calibration of a third order non-linearity, according to someembodiments of the disclosure;

FIG. 8 shows the cumulative distributions for HD2 calibration before andafter calibration of a second order non-linearity, according to someembodiments of the disclosure;

FIG. 9 shows histograms of y₁ and y₂ before and after calibration of athird order non-linearity, according to some embodiments of thedisclosure, according to some embodiments of the disclosure;

FIG. 10 shows cumulative distributions for HD3 distortion, according tosome embodiments of the disclosure, according to some embodiments of thedisclosure;

FIG. 11 shows cumulative distributions before and after HD3 calibration,according to some embodiments of the disclosure;

FIG. 12 shows cumulative distributions before and after a more refinedHD3 calibration, according to some embodiments of the disclosure;

FIG. 13 illustrates a calibration system, according to some embodimentsof the disclosure;

FIG. 14 is a flow diagram illustrating a method for calibrating acircuit, according to some embodiments of the disclosure;

FIG. 15 illustrates another calibration system, according to someembodiments of the disclosure;

FIG. 16 illustrates yet another calibration system, according to someembodiments of the disclosure;

FIG. 17 illustrates yet another calibration system, according to someembodiments of the disclosure; and

FIG. 18 is a flow diagram illustrating a method for calibrating acircuit, according to some embodiments of the disclosure.

DETAILED DESCRIPTION

Overview

Analog circuits are often non-linear or non-ideal, and thenon-linearities or non-idealities can hurt performance. Designers wouldtrade off power consumption to achieve better linearity or have a moreideal circuit. An efficient and effective calibration technique canaddress the non-linearities or non-idealities and reduce the overallpower consumption and achieve the same or better performance. A dithersignal injected to the analog circuit can be used to expose thenon-linear or non-ideal behavior in the digital domain. To detect thenon-linearities or non-idealities, a counting (or histogram-based)approach is applied to isolate non-linearities or non-idealitiesindependent of the input distribution. The approach is superior to anddifferent from other approaches in many ways.

Challenges to Detecting Non-Linearities and Non-Idealities

Performance is greatly affected by the non-linearities (or more broadly,non-idealities) present in the analog circuits making up an ADC. Analogcircuits with non-linearities or non-idealities can include buffers,samplers, and multiplying digital-to-analog converter (MDAC) amplifiers.Digital correction of non-linear or non-ideal behavior the analogcircuits in ADCs, sometimes referred to as “digitally assisted analog”,is an important area of research. If a technique is successful, suchtechniques would enable substantial power reduction and performanceimprovement. A technique is successful if the technique can efficientlyand effectively extract and correct for the non-linearities of acircuit, or more generally, non-ideal components of the circuit. Thecalibration technique is preferably more efficient than implementing amore power hungry but more linear or ideal circuit.

While the description herein refers often to non-linearities, theschemes for dealing with the non-linearities can be extended to addressnon-idealities of a circuit.

Calibration for non-linearities is especially critical in pipelined ADCswhose performance and power consumption are dominated by the MDACamplifiers. Relaxing the linearity requirements of the MDAC amplifiers,while correcting for the undesirable behavior digitally, can lower thepower consumption substantially. The same calibration technique can beused to calibrate other analog circuits in an ADC, such as an inputbuffer, or a sampler.

Correcting the non-linearity and distortion of non-linear analogcircuits would achieve better spurious free dynamic range (SFDR) andintermodulation distortion (IMD) performance at higher inputfrequencies, and reduce power consumption. Calibration is thus one ofthe most differentiating and important means for improving an ADC.

Providing an effective and efficient calibration scheme is not sotrivial. Black-box digital signal processing approaches that attempt toblindly extract and estimate the non-linear behavior of a circuit orsystem in the digital domain are not unheard of. However, thosetechniques suffer from limited effectiveness under varying conditions,and very high power consumption due to the complicated signal processinginvolved.

In one approach, a correlation-based technique is used where multipleuncorrelated dither signals are injected at a point before thenon-linear circuit. If the circuit is linear, those dither signals stayuncorrelated after digitization. In the presence of non-linearity, thedither signals become correlated. The resulting cross-correlationbetween the amplitude of the signal and the amplitude dither signal is ameasure of the non-linearity. Multipliers are usually used forperforming cross-correlation. In some cases, to estimate the third ordernon-linearity, three dither signals are needed. This technique suffersfrom extremely long convergence time, and sensitivity to non-idealitiesin the backend. Also, the need for multiple dither signals leadscompromises the dynamic range and/or power consumption.

In another correlation-based approach, a technique applies piece-wiselinear approximation of the gain. These techniques suffer from longconvergence times as well. In addition, effectively dividing the rangeinto segments while preserving the dither's ability to detect thecorrect gain, leads to approximations that compromise the technique'saccuracy.

In yet another approach, a technique relies on the statistics of thedigitized signal to estimate the circuit's non-linearity. By randomlychanging a Flash ADC's thresholds, this technique creates two differenttransfer characteristics for the same input value: one near the originand the other near the peak. If the circuits were linear, the differencebetween the outputs at any amplitude would be fixed. However, in thepresence of non-linearity, the difference between the two outputs wouldbe different. This difference is a measure of the non-linearity. Bycreating an “error signal” that is proportional to this difference, anadaptation framework can be created to minimize the error using theleast means square (LMS) algorithm. While this technique has relativelygood convergence time, it is sensitive to the input signal'sdistribution and requires changes in the analog circuits (e.g., theFlash ADC) to create two different transfer characteristics. Althoughpromising, it is limited in its applicability.

Improved Calibration Techniques

Addressing some of the shortcomings of other calibration techniques, animproved calibration technique uses a dither signal to expose thenon-linear or non-ideal behavior of an analog circuit in the digitaldomain. The dither signal is injected before the circuit to becalibrated, which can be a sampler, a track and hold circuit, a bufferor an MDAC amplifier. Other analog circuitry can also benefit from theimproved calibration techniques. The dither signal is used in a uniqueway, based on the insight that superposition does not apply innon-linear or non-ideal systems. In other words, if the output of thecircuit is y₁ to a certain input x₁, and if a dither equal to V_(d) isadded to or subtracted from the input, and the same value from theoutput is subtracted or added to obtain y₂, then y₂ will be equal to y₁in a linear system and y₂ will be different from y₁ in a non-linear ornon-ideal system. That difference between y₂ and y₁ can be used toestimate the non-linearities, such as second and third ordernon-linearities, or more generally, non-ideal components of the circuit.

FIG. 1 illustrates injection and removal of dither for a non-linearsystem, according to some embodiments of the disclosure. The non-linearsystem 102, such as an analog circuit under calibration, is representedby function ƒ(x). The input to the function ƒ(x) is represented by x,and the output of the function ƒ(x) is represented by y. In this exampleshown, a dither signal having possible values +V_(d), −V_(d), and 0, canbe injected to the input by summer 104. The same dither signal can beremoved from the output by subtractor 106. When there are one or morenon-linearities, superimposition does not apply, and the injection andsubsequent removal of the dither would result in a difference betweenthe expected (or ideal/linear) output (y₁) and the actual output (y₂).Accordingly, it is possible to extract information about ƒ(x), i.e., thenon-linearities, based on the output y. More specifically, it ispossible to extract information about ƒ(x), i.e., the non-linearities,based on the difference or error between the expected output y₁ and theactual output y₂.

FIG. 2 shows a transfer characteristic of a second order non-linearity,according to some embodiments of the disclosure. The X-axis representsthe input, and the Y-axis represents the output. Curve 202 illustratesthe input to output relationship of an exemplary linear system. Curve204 illustrates the input to output relationship of an exemplary systemhaving a second order non-linearity. δ2 represents the error, ordifference between the expected output and the actual output, where thedifference is a result of the second order non-linearity. Note that theerror is evenly symmetric around the x=0 axis.

FIG. 3 shows a transfer characteristic of a third order non-linearity,according to some embodiments of the disclosure. The X-axis representsthe input, and the Y-axis represents the output. Curve 302 illustratesthe input to output relationship of an exemplary linear system. Curve304 illustrates the input to output relationship of an exemplary systemhaving a third order non-linearity. δ3 represents the error ordifference between the expected output and the actual output, where thedifference is a result of the third order non-linearity. Note that theerror is oddly symmetric around the x=0 axis.

Suppose the input to output relationship for x₁ and y₁ is the following:y ₁=ƒ(x ₁)  (1)

If a dither V_(d) is injected and removed, then the input to outputrelationship for x₁ and y₂ is the following (where

is the estimate of ƒ(V_(d)), which is a value of the dither after it hasbeen processed by the function ƒ(x)):y ₂=ƒ(x ₁ +V _(d))−

  (2)

If ƒ(x) is linear, theny ₁=ƒ(x ₁)=ax ₁  (3)andy ₂ =ax ₁ +aV _(d) −

=ax ₁ +aV _(d) −aV _(d) =ax ₁  (4)

Therefore,y ₁ =y ₂  (5)

If ƒ(x) is non-linear, then:y ₁ ≠y ₂  (6)

For example, if ƒ(x) is a 3^(rd) order non-linear function:y ₁=ƒ(x ₁)=ax ₁ +αx ₁ ³  (7)andy ₂=ƒ(x ₁ +V _(d))−

=a(x ₁ +V _(d))+α(x ₁ +V _(d))³ −

≠y ₁  (8)

The only way for y₁ and y₂ to be equal for multiple values of x₁ andV_(d) is when α is equal to zero (i.e., when the third order function isgone). Moreover, the above equation means that the relationship betweenthe outputs for different dither values, i.e., different values forV_(d) can be used to estimate the nature and magnitude of thenon-linearity. In some cases, an output y₁ can refer to an output as aresult of adding and removing dither having a first dither value, andthe output y₂ can refer to an output as a result of adding and removingdither having a second dither value (different from the first dithervalue).

FIG. 4 illustrates input to output relationships of a linear system anda system in the presence of a third order non-linearity, according tosome embodiments of the disclosure. The X-axis represents the input tothe system. The Y-axis represents the output of the system. Note thatthe error is oddly symmetric around the x=0 axis. Curve 402 shows theinput to output relationship of a linear system. Curve 404 shows theinput to output relationship of a non-linear system, or the transfercharacteristic of output y₁, without the use of dither. Curve 406 showsthe input to output relationship of a non-linear system, or the transfercharacteristic of output y₂, with the use of dither and the ditherinjected and removed to expose non-linearities. FIG. 5 shows adifference between the output y₂ and the output y₁ in the presence ofthe third order non-linearity, according to some embodiments of thedisclosure. Curve 502 shows a difference or error, i.e., y₂−y₁, whichcan be used as an estimate for the non-linearity.

FIG. 6 illustrates input to output relationships of a linear system anda system in the presence of a second order non-linearity, according tosome embodiments of the disclosure. The X-axis represents the input tothe system. The Y-axis represents the output of the system. Note thatthe error is evenly symmetric around the x=0 axis. Curve 602 shows theinput to output relationship of a linear system. Curve 604 shows theinput to output relationship of a non-linear system, or the transfercharacteristic of output y₁, without the use of dither. Curve 606 showsthe input to output relationship of a non-linear system, or the transfercharacteristic of output y₂, with the use of negative dither and thedither injected and removed to expose non-linearities. Curve 608 showsthe input to output relationship of a non-linear system, or the transfercharacteristic of output y₃, with the use of positive dither and thedither injected and removed to expose non-linearities. It can be seenthat different values of the dither causes the system to exhibitdifferent transfer characteristics, when the system is non-linear (ormore broadly, not ideal).

In practice, there is no direct access to the input (x) of the systembeing calibrated. There is however access to the output (y) of thesystem being calibrated, e.g., in the digital domain. In other words, itis not possible to generate plots of the transfer characteristics seenin FIG. 6. To deduce information about the non-linearities (i.e., thetransfer characteristics), it is possible to use counts or histograms ofthe output values (e.g., differential non-linearity or DNL) and/orcumulative sums or cumulative distribution functions (CDF) (e.g.,integral non-linearity or INL) information, computed for differentvalues of the dither, to deduce the input behavior and transfercharacteristic for a certain input/output value. This counting approachto estimate the input behavior and transfer characteristic differencesbetween different dither values is a deterministic method that canachieve fast convergence in the presence or absence of an input signal.

While there can be similarities of this scheme with other techniques,this calibration approach utilizes additive dither signals to expose thenon-linearity, and do not require analog changes to the circuitry of asub-ADC (Flash ADC) within an ADC. More importantly, this calibrationapproach is dither-dependent, and not input-dependent. The calibrationapproach relies on counting instead of using multipliers to computecross-correlations. The use of an additive dither also means that thecalibration approach can be applied on any non-linear system or circuitwhere additive dither is injected (i.e., not just MDACs of an ADC). Thecalibration approach is not trivial, since the setup creates somechallenges relating to how to accurately detect or deduce thenon-linearity from the dither and output values. These challenges areaddressed in the passages which follow.

Exposing and Extracting the Non-Linearity Through the Additive Dither

The dither (e.g., a random value) being injected and removed can beuniformly distributed between two, three, or more values. For example, asuitable dither can be randomly distributed between three values: V_(d),−V_(d), and 0. Another suitable dither can be randomly distributedbetween two values: V_(d) and −V_(d). The value of the dither is known.The dither is added/injected to the system when it is injected, andsubsequently subtracted/removed from the system when it is removed.

The output of the system can be checked at certain values, referredherein as inspection points (e.g., V_(insp)). The system, which is ananalog circuit under calibration, can generate an analog output that canbe digitized by an ADC. Accordingly, a digital signal y (which is adigital output of the ADC) can be used to represent the (analog) outputof the system. Herein, the digital signal y can be used interchangeablywith the (analog) output of the system.

To check the output of the system, the inspection points are used todefine ranges in the output where counts can be accumulated (orcumulative histograms can be determined or computed). The exactmagnitudes of the inspection points are not critical, but the inspectionpoints are determined or chosen to expose the harmonic (i.e.,non-linearity) to be detected, more specifically, a shape/patternassociated with the harmonic to be detected. For example, since secondorder distortion (second harmonic HD2) causes evenly symmetrical errorsaround the center point, while third order distortion (third harmonicHD3) causes oddly symmetrical errors around the center point, theinspection points for the detection and correction of HD2 and HD3 can beat +/−V_(insp), where V_(insp) is an arbitrary value. It can be, forexample, at the magnitude of the dither signal where V_(insp)=V_(d) orat half of the dither signal where V_(insp)=V_(d)/2. For a higher orderdistortion (such as fifth or seventh), the inspection point ispreferably at a relatively large amplitude to expose the severecompression caused by the higher order distortion near the ends of thesignal range. In some cases, the inspection points can also be fixed orchanging (randomly or deterministically) to accommodate different inputconditions. A large inspection point may be more effective in detectingthe non-linearity, but may have less hits depending on the inputconditions. Multiple inspection points can also be used to improve theconvergence time and/or improve the detection effectiveness.

One technical advantage of the calibration technique is that thetechnique is independent of the input distribution. To achieve thisadvantage, the error signal generated by the technique is in the form ofdifferences between distributions defined at the same output value(i.e., a chosen inspection point). By defining the error signal in a wayto not rely on the input distribution or the exact shape of the inputdistribution, independence from the input distribution can be achieved.Moreover, in some cases, a multi-level dither can be used to extract thenon-linearity in the absence of an input signal.

The error signal generated by the technique can represent the differencein the outputs for the various dither cases at a given inspection point,since the outputs for the various dither cases (i.e., with the ditherinjected and moved) at a given inspection point expose thenon-linearities in the system. If the system is linear (or more broadly,ideal), then outputs or counts/histograms for various dither cases atthe given inspection point are expected to be the same. However, if thesystem is non-linear (or more broadly, not ideal), then the outputs orcounts/histograms on the outputs for various dither cases at the giveninspection point are not the same. Errors can be defined based on thecounts/histograms to expose a particular non-linearity or non-ideality.The technical task of the calibration technique is to minimize thaterror or error signal, and linearize the system.

FIG. 7 shows the difference in the outputs (e.g., y₂−y₁) before andafter calibration of a third order non-linearity, according to someembodiments of the disclosure. Curve 702 is the difference in theoutputs (e.g., y₂−y₁) before calibration. Curve 704 is the difference inthe outputs (e.g., y₂−y₁) after calibration. Since the calibrationtechnique does not have access to the input with the desired accuracy,the calibration technique utilizes histograms or cumulative distributionfunctions defined by inspection points to estimate the input andtransfer characteristic for different dither values and extract thenon-linearities. Phrased differently, the calibration technique does nothave direct access to the error signal or how the dither actuallyaffects the transfer characteristic. However, the calibration techniquecan utilize histograms or cumulative distribution functions defined byinspection points, as estimates of the transfer characteristics, andcompare the estimates between different dither values, to estimate whatthe error is for a given output value (i.e., inspection point). Based onthe histograms or cumulative distribution functions defined byinspection points, comparison of the estimates for different dithervalues, and appropriate error equations, it is possible to extractinformation about the non-linearities (being exposed as an error betweendifferent dither values) and correct for the non-linearities (drive theerrors to zero). Specifically, the calibration technique canprogressively correct the non-ideal components of the circuit, use acorrected output to update future estimates of the non-ideal componentsof the circuit, and drive the errors towards zero in a closed-loopmanner. More specifically, the differences in distributions/estimatesfor different dither values at various inspection points can formpartial errors that can be used to form the error estimate (or errorsignal) of a given non-linearity (or more generally, a component of thecircuit being calibrated). After calibration, distortions on the outputcan be significantly reduced, as illustrated in FIG. 7.

Exposing and Extracting Second Order Distortion

For second order distortion, two inspection points such as +/−V_(insp)(e.g., positive inspection point V_(insp) and negative inspection point−V_(insp)) can be chosen. The inspection points can be chosen to be at aconvenient or suitable amplitude, e.g., using two dither amplitudes at+/−V_(d). The inspection points can define ranges of the output. A rangeof the output defined by an inspection point means that the inspectionpoint can serve as an end point of an open interval or closed intervalof the output. Estimates based on counts/histograms can be computedbased on the ranges defined by the inspection points. Estimates based ona given range defined by an inspection point, as used herein, meanscounting samples falling within the given range and deriving a count ora cumulative histogram. Estimates are computed separately for differentvalues of the dither. The count is an estimate of the transfercharacteristic, thus non-idealities, at a given inspection point for aspecific value of the dither. On the digital backend, the number ofpoints (e.g., histograms and cumulative probability distributions) ofthe output having amplitudes less than or equal to +/−V_(insp), or morethan or equal to +/−V_(insp) can be calculated for: (1) the case whenthe dither is equal to positive dither V_(d) (e.g., counting the numberof points of the output after subtracting the ideal/estimated dithervalue), (2) the case when the dither is equal to negative dither −V_(d)(e.g., counting the number of points of the output after adding theideal/estimated dither value), and/or (3) the case when the dither isequal to zero. By comparing the counts/cumulative histograms (i.e., theestimates) between different values of the dither, it is possible toestimate/extract the error of the circuit, since the counts/cumulativehistograms for different values of the dither are expected to be thesame if the circuit is linear (or more broadly, ideal).

The difference of the counts/cumulative histograms for the two cases(i.e., the two dither values) is expected to be fixed and independent ofthe amplitude (i.e., independent of the input distribution). Therefore,the difference (which would be present in the presence of second ordernon-linearity) can qualify as a part of an “error signal” ε.Specifically, parts of the error signal ε (referred herein as partialerrors) are given by (partial) error at the positive inspection pointV_(insp) and (partial) error at the negative inspection point −V_(insp):ε_(HD2)(V _(insp))=Cumsum_(V) _(insp) (V _(out)−Dither)|_(Dither=V) _(d)−Cumsum_(V) _(insp) (V _(out)−Dither)|_(Dither=−V) _(d)   (9a)andε_(HD2)(−V _(insp))=Cumsum_(−V) _(insp) (V _(out)−Dither)|_(Dither=−V)_(d) −Cumsum_(−V) _(insp) (V _(out)−Dither)|_(Dither=V) _(d)   (10a)

Cumsum_(x)(y) is the cumulative histogram (i.e., count) of digital codesof digital signal y less than or equal to x.

The errors are computed by examining the output, i.e., the output withthe dither removed, for a block of data on the output and associateddither values. For instance, if the dither is negative, the errors arecomputed by examining V_(out)+V_(d) or if the dither is positive, theerrors are computed by examining V_(out)−V_(d)·ε_(HD2)(V_(insp)), theerror at the positive inspection point V_(insp), is the difference incounts of the output less than or equal to the positive inspection pointV_(insp) between the two cases where the dither is positive and when thedither is negative. ε_(HD2) (−V_(insp)), the error at the negativeinspection point −V_(insp), is the difference in counts of the outputless than or equal to the negative inspection point −V_(insp) betweenthe two cases where the dither is negative and when the dither ispositive. Alternatively and in general, histograms can be used in placeof cumulative distributions. The error signal can be based on partialerrors computed at multiple inspection points to speed up theconvergence.

Instead of comparing the cases when the dither is positive and when thedither is negative, ε_(HD2)(V_(insp)), the error at the positiveinspection point V_(insp), can be defined as the difference in counts ofthe output less than or equal to the positive inspection point V_(insp)between the two cases where the dither is positive and when the ditheris zero. ε_(HD2)(V_(insp)), the error at the negative inspection point−V_(insp), can be defined as the difference in counts of the output lessthan or equal to the negative inspection point −V_(insp) between the twocases where the dither is negative and when the dither is zero:ε_(HD2)(V _(insp))=Cumsum_(V) _(insp) (V _(out)−Dither)|_(Dither=V) _(d)−Cumsum_(V) _(insp) (V _(out))|_(Dither=0)  (9b)andε_(HD2)(−V _(insp))=Cumsum_(−V) _(insp) (V _(out)−Dither)|_(Dither=−V)_(d) −Cumsum_(−V) _(insp) (V _(out))|_(Dither=0)  (10a)

When the dither is zero (Dither=0), then the sample being observed isV_(out)−Dither=V_(out).

FIG. 8 shows the cumulative distributions for HD2 calibration before andafter calibration of a second order non-linearity, according to someembodiments of the disclosure. Cumulative distributions arerepresentative of integral non-linearity. Curves 802 are the cumulativedistributions for HD2 calibration before calibration, and curves 804 arethe cumulative distributions after HD2 calibration.

Since the errors represent a difference between the counts of the sameoutput (i.e., output code) using two different changes to the inputsignal (i.e., adding V_(d) and subtracting V_(d) when the dither ispositive and when the dither is negative, respectively), the errors willbe independent of the input signal distribution. Provisions can beapplied to ensure the disposal of old/stale data points and the“freshness” of the samples from both distributions (i.e., +/−V_(d)).

The error ε_(HD2) for second order distortion, represented by the(partial) errors at the inspection points, is given by:ε_(HD2)=ε_(HD2)(V _(insp))+ε_(HD2)(−V _(insp))  (11)

In other words, the error ε_(HD2) is the sum of the errors at the twoinspection points. Summing the errors can expose or accentuate the evenorder symmetry associated with second order non-linearity. Thecalibration technique can drive the error ε_(HD2) to/towards zero toremove the second order distortion.

The error ε_(HD2) can be incorporated in a LMS algorithm update equationto minimize the error (e.g., reduce the error to zero or drive the errortowards zero, through progressively correcting the circuit based on theestimate of the component of the circuit), as follows:∝(n+1)=∝(n)−μ×ε_(HD2)  (12)

where the update equation can update an estimate for a component of thecircuit, e.g., the HD2 non-linearity ∝, based on the error ε_(HD2) and astep size μ.

For inspection points at any amplitude, the error ε_(HD2) can be definedto accommodate different representations of the histograms and changesin polarities at large voltages. A suitable formula for ε_(HD2) is asfollows:ε_(HD2)=[Hist_(Vinsp)(V _(out)−Dither)|_(Dither=V) _(d) ×V_(insp)+Hist_(−Vinsp)(V _(out)+Dither)|_(Dither=−V) _(d) ×(−V_(insp))][ε_(HD2)(V _(insp))+ε_(HD2)(−V _(insp))]²  (13)

Hist_(a)(b) represents a count or number of hits of b in bin a (i.e.,count/number of hits of b having the value a). The error ε_(HD2) asdefined in equation (13) is a product of (1) a count of the output withthe dither removed when the dither is positive having the value at thepositive inspection point V_(insp) times the value of the positiveinspection point V_(insp), plus a count of the output with the ditherremoved when the dither is negative having the value at the negativeinspection point −V_(insp) times the value of the negative inspectionpoint −V_(insp), and (2) squared value of the error defined in equation(11). This alternative formula for ε_(HD2) highlights that variations onthe error formulation are possible, and the variations are envisioned bythe disclosure.

In addition, a parameter HD2_(flag) can be calculated to isolate the HD2from HD3 by enhancing the even symmetrical errors, which are due to HD2,while attenuating the odd symmetrical errors, which are characteristicof HD3.HD2_(flag)=|Cumsum_(V) _(insp) (V _(out))|_(Dither=0)+Cumsum_(−V)_(insp) (V _(out))|_(Dither=0)|  (14)

The parameter HD2_(flag) captures a sum of the count of the output lessthan or equal to the positive inspection point and the count of theoutput less than or equal to the negative inspection point when thedither is zero. The error ε_(HD2) and parameter HD2_(flag) can beincorporated in a LMS update equation to minimize the error and form anestimate of the HD2 component of the circuit, as follows, utilizing theparameter HD2_(flag):∝(n+1)=∝(n)−μ×ε_(HD2) ×HD2_(flag)  (15)

In practice, the error defined by equation (11) is adequate for HD2estimation. However, equation (13) and additional parameter HD2_(flag)defined in equation (14) are given as other examples to illustrate theflexibility of this approach. That is, the error can be defined in aconvenient/suitable way that extracts the non-linear shape usinghistograms/distributions and sample counting.

The corrected outputs can be modified as follows, in the digital domain,using the estimated second order non-linearity ∝ and a model for thesecond order non-linearity:V _(out) _(cal) |_(Dither=±V) _(d) =V _(out)|_(Dither=±V) _(d) −∝(n+1)×V_(out) ²|_(Dither=±V) _(d)   (16a)

The correction is independent of the dither value, and accordingly,equation (16a) can be simplified as follows:V _(out) _(cal) =V _(out)−∝(n+1)×V _(out) ²  (16b)

To account for the varied/higher order effects of the correction, abetter correction can be applied using the formula (utilizing a morerefined model for the non-linearities):V _(out) _(cal) |_(Dither=V) _(d) =V _(out)|_(Dither=V) _(d) −∝(n+1)×V_(out) ²|_(Dither=V) _(d) +2∝²(n+1)×V _(out) ³|_(Dither=V) _(d)   (17a)andV _(out) _(cal) |_(Dither=−V) _(d) =V _(out)|_(Dither=−V) _(d) −∝(n+1)×V_(out) ²|_(Dither=−V) _(d) +2∝²(n+1)×V _(out) ³|_(Dither=−V) _(d)  (17b)

The correction is independent of the dither value, and accordingly,equations (17a) and equations (17b) can be simplified as follows:V _(out) _(cal) =V _(out)−∝(n+1)×V _(out) ²+2∝²(n+1)×V _(out) ³  (18)

The updated output signals V_(out) _(cal) can be used in futureestimates of the error (in other words, calibration is being performedin a closed-loop form), as follows:ε_(HD2)(V _(insp))=Cumsum_(V) _(insp) (V _(out) _(cal)−Dither)|_(Dither=V) _(d) −Cumsum_(V) _(insp) (V _(out) _(cal)−Dither)|_(Dither=−V) _(d)   (19a)andε_(HD2)(−V _(insp))=Cumsum_(−V) _(insp) (V _(out) _(cal)−Dither)|_(Dither=−V) _(d) −Cumsum_(−V) _(insp) (V _(out) _(cal)−Dither)|_(Dither=V) _(d)   (20a)

Alternatively, the future estimates of the error can be defined asfollows:ε_(HD2)(V _(insp))=Cumsum_(V) _(insp) (V _(out) _(cal)−Dither)|_(Dither=V) _(d) −Cumsum_(V) _(insp) (V _(out) _(cal))|_(Dither=0)  (19b)andε_(HD2)(−V _(insp))=Cumsum_(−V) _(insp) (V _(out) _(cal)−Dither)|_(Dither=−V) _(d) −Cumsum_(−V) _(insp) (V _(out) _(cal))|_(Dither=0)  (20b)

Exposing and Extracting Third Order Distortion

For third order distortion, the same inspection points as those used forsecond order distortion HD2, e.g., positive inspection point V_(insp)and negative inspection point −V_(insp), can be used. Alternatively, theinspection points can be chosen to be at multiple amplitudes, e.g., somedither amplitude +/−V_(d), another smaller dither amplitude, and zerodither. Generally speaking, the inspection points are chosen to exposethe odd symmetry of a third order distortion.

In one example, on the digital backend, the number of points (e.g.,histograms and cumulative probability distributions) of the outputhaving amplitudes less than or equal to +/−V_(insp) are calculated forthe case when the dither is equal to positive dither V_(d) (counting thenumber of points of the output after removing/subtracting theideal/estimated dither value), output having amplitudes less than orequal to +/−V_(insp) are calculated for the case when the dither isequal to negative dither −V_(d) (counting the number of points of theoutput after removing/adding the ideal/estimated dither value), and/orthe case when the dither is equal to zero (counting the number of pointsof the output with a zero dither). The difference of thecounts/cumulative statistics for two cases (i.e., the two differentdither values) is expected to be fixed and independent of the amplitude(i.e., independent of the input distribution). Therefore, the difference(which would be present in the presence of third order non-linearity)can qualify as a part of an “error signal” ε, and parts of the errorsignal are given by a (partial) error at the positive inspection pointV_(insp) and a (partial) error at the negative inspection pointV_(insp):ε_(HD3)(V _(insp))=Cumsum_(V) _(insp) (V _(out)−Dither)|_(Dither=V) _(d)−Cumsum_(V) _(insp) (V _(out))|_(Dither=0)  (21a)andε_(HD3)(−V _(insp))=Cumsum_(−V) _(insp) (V _(out)−Dither)|_(Dither=−V)_(d) −Cumsum_(−V) _(insp) (V _(out))|_(Dither=0)  (22a)andε_(HD3)=ε_(HD3)(V _(insp))−ε_(HD3)(−V _(insp))  (23)

Alternatively, dither amplitudes of +/−V_(d) can be used as theinspection points as was used for HD2. ε_(HD3)(V_(insp)), the (partial)error at the positive inspection point V_(insp), is the difference incounts of the output less than or equal to the positive inspection pointV_(insp) between the two cases where the dither is positive and when thedither is zero. ε_(HD3)(−V_(insp)), the (partial) error at the negativeinspection point −V_(insp), is the difference in counts of the outputless than or equal to the negative inspection point −V_(insp) betweenthe two cases where the dither is negative and when the dither is zero.

Instead of comparing the cases when the dither is positive and when thedither is zero, or when the dither is negative and when the dither iszero, ε_(HD3)(V_(insp)), the (partial) error at the positive inspectionpoint V_(insp), can be defined as the difference in counts of the outputless than or equal to the positive inspection point V_(insp) between thetwo cases where the dither is positive and when the dither is negative.ε_(HD3)(−V_(insp)), the (partial) error at the negative inspection point−V_(insp), can be defined as the difference in counts of the output lessthan or equal to the negative inspection point −V_(insp) between the twocases where the dither is negative and when the dither is positive:ε_(HD3)(V _(insp))=Cumsum_(V) _(insp) (V _(out)−Dither)|_(Dither=V) _(d)−Cumsum_(V) _(insp) (V _(out)−Dither)|_(Dither=−V) _(d)   (21b)andε_(HD3)(−V _(insp))=Cumsum_(−V) _(insp) (V _(out)−Dither)|_(Dither=−V)_(d) −Cumsum_(−V) _(insp) (V _(out)−Dither)|_(Dither=V) _(d)   (22b)

As seen in equation (23), the error ε_(HD3) is the difference of theerrors at the two inspection points. The calibration technique can drivethe error ε_(HD3) to zero to remove the third order distortion. The maindifference for extracting the error for HD3 from HD2 is the subtractiondone in (23) as opposed to the addition done for HD2 extraction in (11).This is because of the odd symmetry of the HD3 non-linearity as opposedto the even symmetry of HD2 non-linearity.

The error for third order distortion ε_(HD3) is used in an LMS updateequation obtain new estimates for the third order distortion ∝ andminimize the error:∝(n+1)=∝(n)+μ×ε_(HD3)  (24)

Additionally, to emphasize or enhance the HD3 pattern of odd symmetry,an HD3_(flag) signal can be used:HD3_(flag)=|Cumsum_(V) _(insp) (V _(out))|_(Dither=0)−Cumsum_(−V)_(insp) (V _(out))|_(Dither=0)|  (25)

The parameter HD3_(flag) captures a difference of the count of theoutput less than or equal to the positive inspection point V_(insp) andthe count of the output less than or equal to the negative inspectionpoint −V_(insp) when the dither is zero. The error ε_(HD3) and parameterHD3_(flag) is incorporated in an LMS update equation to minimize theerror and form an estimate of the HD3 component of the circuit, asfollows:∝(n+1)=∝(n)+μ×ε_(HD3) ×HD3_(flag)  (26)

To correct for third order non-linearity, the calibrated outputs aremodified as follows:V _(out) _(cal) |_(Dither=±V) _(d) =V _(out)|_(Dither=±V) _(d) −∝(n+1)×V_(out) ³|_(Dither=±V) _(d)   (27a)

The correction is independent of the dither value, and accordingly,equation (27a) can be simplified as follows:V _(out) _(cal) =V _(out)−∝(n+1)×V _(out) ³  (27b)

FIG. 9 shows histograms of y₁ and y₂ before and after calibration of athird order non-linearity, according to some embodiments of thedisclosure, according to some embodiments of the disclosure. Curves 902and 904 are histograms before calibration. Curve 906 are histogramsafter calibration. Different dither values affect the output, which isevidence that the circuit is not linear. After calibration, thedifferent dither values do not affect the output, which is evidence thatthe circuit is (more) linear after calibration.

FIG. 10 shows cumulative distributions (INL) for HD3 distortion,according to some embodiments of the disclosure, according to someembodiments of the disclosure. Curve 1002 is a cumulative distributionfor the case when dither is zero (or no dither). Curve 1004 is acumulative distribution for the case when dither is positive. Curve 1006is for the case with the dither subtracted.

FIG. 11 shows cumulative distributions before and after HD3 calibration,according to some embodiments of the disclosure. Curves 1102 are thecumulative distributions after HD3 has been calibrated out, usingequations (26), (27a), and (27b).

To account for the higher order effects of the correction, a (better)correction can be applied using the formulas:V _(out) _(cal) |_(Dither=±V) _(d) =V _(out)|_(Dither=±V) _(d) −∝(n+1)×V_(out) ³|_(Dither=±V) _(d) +3∝²(n+1)×V _(out) ⁵|_(Dither=±V) _(d)  (28a)andV _(out) _(cal) |_(Dither=0) =V _(out)|_(Dither=0)−∝(n+1)×V _(out)³|_(Dither=0)+3∝²(n+1)×V _(out) ⁵|_(Dither=0)  (28b)

Equations (28a) and (28b) can correct for HD5 effect of the HD3correction.

The correction is independent of the dither value, and accordingly,equations (28a) and (28b) can be simplified as follows:V _(out) _(cal) =V _(out)−∝(n+1)×V _(out) ³+3∝²(n+1)×V _(out) ⁵  (29)

FIG. 12 shows cumulative distributions before and after a more refinedHD3 calibration, according to some embodiments of the disclosure. Curves1102 are the cumulative distributions after HD3 has been calibrated out,using equations (26), (28a), (28b), and (29).

The updated output signals V_(out) _(cal) are used in future estimatesof the error (in other words, calibration being performed in aclosed-loop form), as follows, as an example:ε(V _(insp))=Cumsum_(V) _(insp) (V _(out) _(cal) −Dither)|_(Dither=V)_(d) −Cumsum_(V) _(insp) (V _(out) _(cal) )|_(Dither=0)  (30)

Equation (30) reformulates equation 21a to use updated output signalsV_(out) _(cal) in error estimates. Equations (22a), (21b), and (22b)(and more broadly, other (partial) error estimation equations envisionedby the disclosure) can also be reformulated in a same fashion asequation (30) to use updated output signals V_(out) _(cal) in errorestimates.

Exposing and Extracting Fifth Order Distortion (and Fourth OrderDistortion)

The model for fifth order distortion on the output can be defined as:v _(out)=∝₁ x+∝ ₃ x ³+∝₅ x ⁵  (31)

∝₁ is an estimate of a first order distortion of the circuit, ∝₃ is anestimate of a third order distortion of the circuit, and ∝₅ is anestimate of the fifth order distortion of the circuit. The output can becorrected using the following approximate formula:v _(out) _(corr) =v _(out)−γ₃ v _(out) ³−γ₅ v _(out) ⁵−γ₇ v _(out) ⁷−γ₉v _(out) ⁹  (32)

Such that, if ∝₁=1:γ₃=∝₃  (33)andγ₅=∝₅−3γ₃ ²  (34)andγ₇=−3γ₃ ³−5γ₃γ₅−3γ₃∝₅  (35)andγ₉=−γ₃ ⁴−16γ₃ ²γ₅−5γ₅∝₅  (36)

The estimation of the third order non-linearity can be performed asdescribed herein. The detection of the fifth order non-linearity occursin a manner similar to the third order but using a larger inspectionpoint (an inspection point having a larger magnitude than the ones usedfor extracting the third order non-linearity). If V_(insp1) was used forextracting the third order non-linearity, then the inspection point toextract the fifth order non-linearity, V_(insp5), isV_(insp5)>|V_(insp1)|, since fifth order distortion tends to show moresevere compression near large amplitudes compared to third orderdistortion. In addition, the convergence is to be done such that thirdorder convergence happens first, followed by fifth order convergence.The error estimation equations are given by:ε_(HD5)(V _(insp5))=Cumsum_(V) _(insp5) (V _(out)−Dither)|_(Dither=V)_(d) −Cumsum_(V) _(insp5) (V _(out))|_(Dither=0)  (37a)andε_(HD5)(−V _(insp5))=Cumsum_(−V) _(insp5) (V _(out)−Dither)|_(Dither=−V)_(d) −Cumsum_(−V) _(insp5) (V _(out))|_(Dither=0)  (38a)

ε_(HD5)(V_(insp5)), the (partial) error at the positive inspection pointV_(insp5), is the difference in counts of the output less than or equalto the positive inspection point V_(insp5) between the two cases wherethe dither is positive and when the dither is zero. ε_(HD5)(V_(insp5)),the (partial) error at the negative inspection point −V_(insp5), is thedifference in counts of the output less than or equal to the negativeinspection point −V_(insp5) between the two cases where the dither isnegative and when the dither is zero.

Instead of comparing the cases when the dither is positive and when thedither is zero, or when the dither is negative and when the dither iszero, ε_(HD5)(V_(insp5)), the error at the positive inspection pointV_(insp5), can be defined as the difference in counts of the output lessthan or equal to the positive inspection point V_(insp5) between the twocases where the dither is positive and when the dither is negative.ε_(HD5)(V_(insp5)), the error at the negative inspection point−V_(insp5), can be defined as the difference in counts of the outputless than or equal to the negative inspection point −V_(insp5) betweenthe two cases where the dither is negative and when the dither ispositive:ε_(HD5)(V _(insp5))=Cumsum_(V) _(insp5) (V _(out)−Dither)|_(Dither=V)_(d) −Cumsum_(V) _(insp5) (V _(out)−Dither)|_(Dither=−V) _(d)   (37b)andε_(HD5)(−V _(insp5))=Cumsum_(−V) _(insp5) (V _(out)−Dither)|_(Dither=−V)_(d) −Cumsum_(−V) _(insp5) (V _(out)−Dither)|_(Dither=V) _(d)   (38b)

Then, the error is defined as:ε_(HD5)=ε_(HD5)(V _(insp5))−ε_(HD5)(−V _(insp5))  (39)

In other words, the error ε_(HD5) is the difference of the errors at thetwo inspection points, as computed by the partial errors illustrated inequations (37a), (37b), (38a), and (38b). The calibration technique candrive the error ε_(HD5) to zero to remove the fifth order distortion.

The error ε_(HD5) is incorporated in an LMS update equation to minimizethe error and update the distortion estimate ∝ (estimate of the HD5component of the circuit), as follows:∝(n+1)=∝(n)+μ×ε_(HD5)  (40)

Similarly, this approach can be used to extract higher order terms orterms not mentioned herein for the sake of brevity. For example, thedetection of the fourth order non-linearity occurs in a manner similarto the second order but using a larger inspection point (an inspectionpoint having a larger magnitude than the ones used for extracting thesecond order non-linearity, or V_(insp4)>|V_(insp1)|), since fourthorder distortion tends to show more severe compression near largeamplitudes compared to second order distortion. In addition, theconvergence is to be done such that second order convergence happensfirst, followed by fourth order convergence. The error for HD4 can bedefined as a sum of the partial errors at the two inspection points.

Broadly speaking, the calibration technique identifies the shape orpattern of the given non-linearity, then applies a histogram and/orcumulative distribution based calculation that captures theshape/pattern for different dither values to extract and correct for thenon-linearity.

Extracting and Calibrating Gain Information

Besides exposing non-linearity, counts such as histograms and cumulativedistributions and comparing the counts between dither values can be usedto estimate the gain as well (gain being another component of thecircuit being calibrated). In some cases, the gain is not ideal, and mayneed to be corrected. In other words, the calibration scheme can alsoextract the first order term, not just the high order non-linear terms.In some cases, extracting for the first order term can help ensure theaccurate convergence of the non-linear terms. In other approaches, acorrelation method correlating a dither against a signal is used toestimate the gain term using the equation:G _(e)[n+1]=G _(e)[n]+μ·V _(d)[n]·(V _(out)[n]−G _(e)[n]·V_(d)[n])  (41)

This equation (41) estimates the overall average gain of the wholetransfer characteristics, which can be affected by any non-linearitythat exists.

Using the histogram/counting technique, the gain can be estimated bychoosing the inspection point to be at zero. That is: V_(insp1)=0. Thisis because near zero, the output is exposed to minimal non-linearity.The error terms obtained by placing inspection at zero can isolate thereal linear gain error from the gain error due to compression/expansionof the non-linear residue. It also ensures that the gain convergenceproceeds in the right direction and always helps the non-linear errorconvergence.

Using the histogram method, the (partial) errors can be defined as:ε(0+)=Cumsump ₀₊(V _(out)−Dither_(est))|_(Dither=−Vd)−Cumsump ₀₊(V_(out)−Dither_(est))|_(Dither=+Vd)  (42)andε(0+)=Cumsumn ⁰⁻(V _(out)−Dither_(est))|_(Dither=−Vd)−Cumsumn ⁰⁻(V_(out)−Dither_(est))|_(Dither=+Vd)  (43)

Cumsumn⁰⁻ is the cumulative count below 0, and Cumsump₀₊ is thecumulative count above 0. ε(0+), the first (partial) error at the zeroinspection point V_(insp1)=0 is the difference in counts of the outputbelow zero between the two cases where the dither is negative and whenthe dither is positive. ε(0−), the second (partial) error at the zeroinspection point V_(insp1)=0 is the difference in counts of the outputabove zero between the two cases where the dither is negative and whenthe dither is positive. In this case, the output is the output with anestimate of the dither removed, i.e., V_(out)[n]−Dither_(est). Theestimate of the dither is the dither value V_(d)[n] multiplied by a gainestimate G[n]. If the dither is positive, the output with the estimateof the dither removed is V_(out)G[n]V_(d). If the dither is negative,the output with the estimate of the dither removed is V_(out)+G[n]V_(d).Note that the two partial errors can examine non-overlapping ranges.

The gain error term ε_(G) is defined as:ε_(G)=ε(0+)−ε(0−)  (44)In other words, the error ε_(G) is the difference of the first (partial)error and the second (partial) error. The error ε_(G) can beincorporated into a LMS update equation to compute the gain estimate ofthe circuit:G[n+1]=G[n]−μ_(g)×ε_(G)  (45)where μ_(g) is the LMS step size for the gain convergence. It should benoted that once the convergence is complete and the gain estimate valueof G[n] is obtained, the output needs to be multiplied by (1/G[n]) toremove any linear errors.

If the linear error equations shown above are used with non-zeroinspection points, the converged value of G[n] would correspond to thelinear correction factor at that inspection point on the residue curve.Exemplary partial errors at non-zero inspection points (e.g., V_(inspg))can be defined as:ε(V _(inspg2)+)=Cumsum_(V) _(inspg2) ₊(V_(out)[n]−Dither_(est))|_(Dither=−Vd)−Cumsump _(V) _(inspg2) ₊(V_(out)[n]−Dither_(est))|_(Dither=+Vd)  (46)andε(V _(insp2)−)=Cumsum_(V) _(inspg2) ⁻(V_(out)[n]−Dither_(est))|_(Dither=−Vd)−Cumsum_(V) _(inspg2) ⁻(V_(out)[n]−Dither_(est))|_(Dither=+Vd)  (47)

Cumsumn_(V) _(inspg) ⁻ is the cumulative count below V_(inspg), andCumsump_(V) _(inspg2) ₊ is the cumulative count above V_(inspg).ε(V_(inspg2)+), the first (partial) error at the non-zero inspectionpoint V_(inspg2) is the difference in counts of the output belowV_(inspg2) between the two cases where the dither is negative and whenthe dither is positive. ε(V_(inspg2)−), the second (partial) error atthe non-zero inspection point V_(inspg2) is the difference in counts ofthe output above V_(inspg2) between the two cases where the dither isnegative and when the dither is positive. The gain error term ε_(G) isdefined as:ε_(G2)=ε(V _(inspg2)+)−ε(V _(inspg2)−)  (48)

In other words, the error ε_(G2), i.e., the error at the non-zeroinspection point V_(insp2) is the difference of the first (partial)error and the second (partial) error. The error ε_(G2) can beincorporated into a LMS update equation to compute the gain estimate atthe inspection point V_(insp2):G ₂[n+1]=G ₂[n]−μ_(g2)×ε_(G2)  (49)

where μ_(g) is the LMS step size for the gain convergence.

If gain error calibration is run on a non-linear residue (e.g.,V_(out)[n]−Dither_(est)) with uniformly distributed inspection pointspicked randomly throughout LMS convergence, the final value of G[n]would represent the average gain of the output.

The advantage of the histogram/counting method (i.e., compare estimatesof the transfer characteristics for different dither values) over thetraditional correlation method (i.e., cross-correlate the ditheramplitude with a signal amplitude) is that it estimates the gain at theinspection point, instead of the average gain of the whole transfercharacteristics. Therefore, it is less sensitive to errors due to thenon-linear effects. In addition, it is much simpler and cheaper toimplement because it relies on counters, instead of multiplication(which would be needed for cross-correlations).

By estimating the gain at multiple inspection points using thehistogram/counting method described, a piece-wise linear estimate of thenon-linear transfer characteristic can be obtained for an arbitrarynon-linear function, regardless of its shape or order. The piece-wiselinear estimates can be used to correct the output in a piece-wisemanner, by applying correction coefficients that correspond to differentranges of the output.

Variations to the Partial Error Calculations, Error Formulations, andLMS Equation Formulations

The examples herein merely illustrate exemplary implementations forcarrying out the counting or histogram-based approach. Other solutionsare envisioned by the disclosure.

Partial error equations can differ from one implementation to another.Primarily, the partial error equations compare counts/histograms betweendifferent values of the dither. However, the values of the dither chosenfor the comparison can depend on the implementation. For instance, invarious partial error equations, certain values of the dither are chosenfor the comparison. For instance, equation (9a) compares the counts whenthe dither is positive and when the dither is negative. Equation (10a)compares the counts when the dither is negative and when the dither ispositive. Equation (9b) compares the counts when the dither is positiveand when the dither is zero. Equation (10b) compares the counts when thedither is negative and when the dither is zero. The choice of the valuesof the dither can vary from one implementation to another. Also, thechoice of the values of the dither can depend on the type ofnon-ideality to be extracted and how the error equations are formulatedto extract the non-ideality. Preferably, the values of the dither usedin the comparison are chosen done to expose or accentuate the shape orpattern associated with the non-ideality. Certain values of the dithersignal can result in greater amount of distortion in the output.Choosing those values of the dither signal for the comparison that cancause the greater amount of distortion can make extracting the shape orpattern associated with the non-ideality easier and more effective.

Likewise, the definitions of the partial error equations or parameterscan vary from one implementation to another. Primarily, partial errorequations define ranges based on inspection points, and comparecounts/histogram-based on the ranges. Also, as illustrated by theexamples herein, the definitions of the partial error equations candepend on the type of non-ideality to be extracted. In some cases,various partial error equations or equations defining an error at agiven inspection point can use overlapping ranges. The type of rangesused in partial error equations can differ from one implementation toanother. Alternatively, non-overlapping ranges can be used. Instances ofCumsum_(V) _(insp) (.) for the positive inspection point V_(insp) can bereplaced by Cumsump_(V) _(insp) , where Cumsump_(x)(y) is the cumulativehistogram (i.e., count) of digital codes of digital signal y greaterthan or equal to x. Instances of Cumsum_(−V) _(insp) (.) for thenegative inspection point −V_(insp) can be replaced by Cumsumn_(−V)_(insp) , where Cumsumn_(x)(y) is the cumulative histogram (i.e., count)of digital codes of digital signal y less than or equal to x. Theparameters enhancing even and odd symmetrical errors can also be variedin the same manner to use non-overlapping ranges.

Similarly, the error formulations based on the partial errors can varyfrom one implementation to another. Preferably, the error equations aredefined in such a way to combine partial errors and to expose oraccentuate the shape or pattern associated with the non-ideality. Forinstance, the error equation for error ε_(HD2) is the sum of the errorsat the two inspection points. Summing the errors exposes or accentuatesthe even order symmetry associated with second order non-linearity. Theerror equation for ε_(HD3) is the difference of the errors at the twoinspection points. The difference in the errors exposes or accentuatesthe odd order symmetry associated with third order non-linearity. Thetwo errors, ε_(HD2) and ε_(HD3) are defined in opposite manner of eachother to expose the difference in even and odd symmetries associatedwith the second order non-linearity and third order non-linearityrespectively. The opposite equation formulations can also be used inexposing the difference in symmetries for other pairs of error equationsand non-linearities. Other error formulations are possible so long asthey are defined in such a way to expose or accentuate the differentshapes associated with various non-idealities. Many examples hereinillustrate the flexibility in the approach.

Moreover, the LMS update equations can vary from one implementation toanother. Many examples herein illustrate the flexibility in the approach(e.g., HD2_(flag) can be used as part of the LMS equation. Moreover,depending on the sign of the error (e.g., ε_(HD2)) used in the LMSequation, the LMS equation can be defined to add or subtract the stepsize multiplied by the error (e.g., μ×ε_(HD2)), as long as addition orsubtraction is set as negative feedback in the LMS loop converges.

Implementing Cumulative Histograms Efficiently in Digital Hardware

Many of the equations described herein utilizes cumulative histogramsdefined by inspection points, i.e., accumulating/keeping a count of theoutput falling within a range defined by an inspection point, and thecounts or cumulative histograms are computed based on a block of data ormany samples. Moreover, the error and/or partial errors are defined by acomparison of counts associated with different values of the dither. Inother words, counting and comparing the counts for different dithervalues (e.g., positive dither and negative dither) helps to extractshape/pattern of a non-linearity or gain error at a given inspectionpoint. Calibrating based on a block of data can be robust (making surethat calibrations do not diverge easily, since the errors are beingextracted based on data gathered over a period of time), but it alsomeans that calibration can take more time, and keeping/accumulatingcounts for many samples can add complexity.

Counting the output with the dither removed falling within a rangedefined by an inspection point and comparing counts between differentvalues of the dither signal can be implemented in digital hardwareefficiently, if counting and comparing counts are done incrementally orsample-by-sample (as opposed to computing a cumulative histogram over alarge block of data). Incremental or sample-by-sample counting andupdating an LMS equation at each sample can still converge to minimizethe error and update the estimate of the component of the circuit withinthe calibration loop. Defining and implementing the partial errors anderrors to count sample-by-sample, while preserving the effect ofcomparing counts between different dither values, is not trivial. Theincremental or sample-by-sample counting and comparisons is a specialcase or implementation of the histogram technique.

Instead of counting over a large block of data and determining how manysamples fall within a range defined by an inspection point, incrementalor sample-by-sample counting can determine whether each sample, i.e.,the output with the dither removed, is a hit within the range defined bythe inspection point. If the sample, i.e., the output with the ditherremoved, is a hit, then a value can be assigned to count the sample.Moreover, the comparison between counts can be performed incrementallyif a value of +1 is assigned to a hit for one dither value, and a valueof −1 is assigned to a hit for another dither value. The oppositevalues, e.g., +1 and −1, can represent an incrementaldifference/comparison being made between the two dither cases. As eachsample is counted and the LMS equation is updated, the calibration loopcan converge to a steady state to make sure that the number of hitsresulting in a +1 and the number of hits resulting in a −1 areequalized. When the steady state is reached, it is as if the countsbetween different values of the dither signal are equal, and thus theLMS update equation would stabilize and converge to an appropriateestimate of a component of the circuit. The calculation can besimplified even further if a positive dither and a negative dither isused, since a sign bit of the dither can be used to represent +1 and −1.Accordingly, formulating partial errors and errors and updating an LMSequation using the sign bit of the dither for each hit, can effectivelyyield the same effect as counting and comparing counts between differentdither values.

To implement incremental counting, various error estimate equations,each forming a partial errors at a given inspection point, e.g.,inspection points V_(insp) and −V_(insp), based on cumulative histograms(i.e., count of values with a range defined by the given inspectionpoint) and a difference between two cumulative histograms, can bedefined differently, as follows:ε(V _(insp))=sign(Dither=±V _(d))·hit_(>) _(insp) (V_(out)−Dither_(est))  (50)andε(−V _(insp))=sign(Dither=±V _(d))·hit_(>−V) _(insp) (V_(out)−Dither_(est))  (51)

hit_(>x)(y) returns 1 if y is greater than or equal to x, and returns 0otherwise. hit_(<x)(y) returns 1 if y is less than or equal to x, andreturns 0 otherwise. Dither can have a positive dither value, e.g.,+V_(d), or a negative dither value, e.g., −V_(d). Accordingly,sign(Dither) returns +1 if the dither is a positive dither, andsign(Dither) returns −1 if the dither is a negative dither. If theoutput with the dither removed, e.g., V_(out)−Dither, is a hit withinthe range defined by the inspection point (e.g., greater than or equalto the inspection point V_(insp), or less than or equal to theinspection point V_(insp)), then the sign of the dither value is thepartial error at the inspection point. If the output with the ditherremoved, e.g., V_(out)−Dither, is not a hit within the range defined bythe inspection point, then the partial error at the inspection point iszero.

The above partial errors computed incrementally or sample-by-sample asillustrated above can be used in equations (11) and (23) and (39) toestimate errors for HD2, HD3, and HD5, or other terms that combinepartial errors defined at the inspection points.

The errors for gain estimation, e.g., errors at zero inspection point orerrors at non-zero inspection points, can also be implementedefficiently in hardware. The partial errors are also performing countingand comparisons. For any given inspection point, the partial errors canbe defined as follows:ε(V _(inspg2)+)=sign(Dither=±V _(d))·hit_(>V) _(inspg2) (V_(out)−Dither_(est))  (52)andε(V _(inspg2)−)=sign(Dither=±V _(d))·hit_(<V) _(inspg2) (V_(out)−Dither_(est))  (53)

hit_(>x)(y) returns 1 if y is greater than or equal to x, and returns 0otherwise. hit_(<x)(y) returns 1 if y is less than or equal to x, andreturns 0 otherwise. Dither can have a positive dither value, e.g.,+V_(d), or a negative dither value, e.g., −V_(d). Accordingly,sign(Dither) returns +1 if the dither is a positive dither, andsign(Dither) returns −1 if the dither is a negative dither. For partialerror ε(V_(inspg2)+), the range is defined by the output greater than orequal to V_(inspg2). For partial error ε(V_(inspg2)−) the range isdefined by the output less than or equal to V_(inspg2). The ranges arenot overlapping. For partial error ε(V_(inspg2)+), if the output withthe dither removed, e.g., V_(out)−Dither_(est), is a hit within therange defined by the inspection point (e.g., greater than or equal toV_(inspg2)), then the sign of the dither value is the partial error atthe inspection point. Otherwise, partial error ε(V_(inspg2)+) is 0. Forpartial error ε(V_(inspg2)−) if the output with the dither removed,e.g., V_(out)−Dither_(est), is a hit within the range defined by theinspection point (e.g., less than or equal to V_(inspg2)), then the signof the dither value is the partial error at the inspection point.Otherwise, partial error ε(V_(inspg2)−) is 0.

When the inspection point is at zero, e.g., V_(insp1)=0, theimplementation for incrementally counting the hits for partial errorε(0+) and partial error ε(0−) can become:ε(0+)=sign(Dither=±V _(d))·pos?(V _(out)−Dither_(est))  (54)andε(0−)=sign(Dither=±V _(d))·neg?(V _(out)−Dither_(est))  (55)

When the inspection point is zero, the sign bit of the output with thedither estimate removed (e.g., V_(out)−Dither_(est)) can enable hardwareto easily determine whether the output with the dither estimate beremoved is a hit or not a hit within the range set by a zero inspectionpoint. Accordingly, when the inspection point is zero and the range isdefined by a zero inspection point, the digital implementation can be aspecial case. When the range is defined by zero, whether the output withthe dither estimate removed is positive or negative (as indicated bypos?(.) and neg?(.) respectively) can indicate whether the output withthe dither estimate removed is a hit or not a hit. The operation pos?(y)can return a 1 if y is positive, and return a zero otherwise. Theoperation neg?(y) can return a 1 if y is negative, and return a zerootherwise. Specifically, pos?(.) and neg?(.) can be implemented as adigital/logical operation that examines the sign bit of the output withthe dither removed, and determines whether the output with the ditherestimate removed is a hit within the range or not a hit within the range(without having to perform a comparison). If the output with the ditherremoved, e.g., V_(out)−Dither_(est), is a positive, then ε(0+) has thesign of the dither value is the partial error at the inspection point.ε(0+) is otherwise zero. If the output with the dither removed, e.g.,V_(out)−Dither, is negative, then ε(0−) has the sign of the dithervalue. ε(0−) is otherwise 0.

The error estimate at the zero inspection point, e.g., ε_(G) fromequation (44), can be further simplified to:ε_(G)=ε(0+)−ε(0−)=sign(Dither=±V _(d))·sign(V _(out)−Dither_(est))  (56)

In other words, the error estimate at the zero inspection point (e.g.,for gain), can be done by logically combining the sign bit of the ditherand the sign bit of the output with the dither removed by an “AND”operation. This error estimate at the zero inspection point can be usedto update an LMS equation that updates the estimate of the component ofthe circuit, such as equation (45).

Technical Advantages

The calibration technique based on histograms and/or cumulativedistributions at inspection points can converge substantially fasterthan traditional correlation-based methods that rely on multiple dithersignals. Furthermore, the counts at chosen inspection points expose thenon-idealities of the system without being dependent on the inputdistribution. As a result, calibrations are independent of the inputsignal distribution and whether the input is present or not. In theabsence of an input signal, a multi-level dither can be used forcalibration. The different calculations based on counts of the output atthe inspection points based on different dither values can effectivelyseparate and extract distortion terms such as the second, third, andfifth order distortion. The calibration technique can estimate both theHD2, HD3, HD5, etc. distortions reasonably accurately, even when all arepresent simultaneously. The additive dither being used for thecalibrations mean no drastic changes to the analog design is needed, andonly circuitry for injecting and removing the additive dither is needed.Such circuitry is usually available for dithering out errors in thesystem (e.g., to dither out ADC errors) anyway. More importantly, thecalibration technique can be used on any circuit where dither isinjected and removed. Examples of such circuits can include: buffer,track and hold, MDAC, etc. Some techniques can be applied to an MDACamplifier only, but not other circuits. The calibration technique relieson the shape or pattern that shows up in the output based on differentdither cases, and can effectively estimate and correct arbitrarynon-linearities. Using the combination of gain and non-linear estimates,the technique is capable of estimating and correcting arbitrarynon-linear shapes regardless of their order.

The calibration technique is characterized by many distinguishingfeatures. First, the calibration technique uses an existing dithersignal to expose and estimate the non-linearity in a counting approachthat correlates the output with the dither removed associated withdifferent values of the dither (but not a traditional correlation-basedapproach that cross-correlates the dither amplitude against the outputamplitude). The counting approach examines the output in the presence ofdifferent values of the dither, correlates the output when the dither isone value against the output when the dither is another value, atspecific inspection points. Notably, the counting approach does notdepend on input signal statistics. Rather, the counting approach dependon the dither. The dither-dependent, counting approach, makes thiscalibration technique independent on the input distribution. An addedbenefit of this scheme is that the calibration technique can evenoperate in the absence of an input signal. Second, the calibrationtechnique can isolate the second, third, fifth, and higher ordercomponents accurately in a deterministic framework without making analogchanges. Specifically, the inspection points for the calibrationtechnique are carefully selected to expose the shape/pattern associatedwith various non-ideal components of the circuit. Third, the calibrationtechnique applies efficient and effective calculations defined toextract errors for HD2, HD3, and HD5 for any inspection point and in thepresence of dither. A suitable technique to drive the errors to zero,such as LMS framework, can be used. Besides, the calibration techniquecan be extended to obtain a gain estimate. The overall calibrationapproach can estimate and correct arbitrary non-linearities using thecombination of gain and non-linear estimates at multiple inspectionpoints. Fourth, correlation-based approaches typically try to minimizethe squared error over a whole output range, whereas the calibrationapproach based on counting at a specific inspection point results inestimation of the behavior at a specific point in the output, which canlead to better accuracy when it comes to extracting errors.

EXAMPLES

Example 1 is a calibration system, comprising: dither circuitry forinjecting a dither at an input of a circuit and removing the dither atan output of the circuit; counting circuitry for accumulating counts ofan output within ranges defined by one or more inspection points of theoutput; error circuitry for comparing counts associated with differentvalues of the dither and determining an error estimate; and calibrationcircuitry for driving the error estimate towards zero.

FIG. 13 illustrates a calibration system, according to some embodimentsof the disclosure. The calibration system can be used to calibratecircuit 1302. The dither circuitry corresponds to summer 104 andsubtractor 106. Optionally, the calibration system includes an ADC 1304that digitizes an (analog) output of the circuit 1302. In some cases,the subtractor 106 is implemented in the digital domain to digitallyremove the dither that was injected by summer 104 (i.e., downstream ofADC 1304).

A digital backend can then implement the calibration technique describedherein. A corrected digital output representing the output with thedither removed (post correction) and the dither are provided to countingcircuitry 1306. For example, the counting circuitry 1306 can evaluatecounts or histograms of the output for different values of the dither,based on ranges defined by appropriate inspection points, and enable thecounts/histograms between different values of the dither to be compared.The counting circuitry 1306 can be simple and cheap to implement sinceno multipliers are needed to extract the error of the circuit 1302. Thepartial error circuitry 1307 can determine partial errors at variousinspection points based on the counts from counting circuitry 1306associated with different values of the dither. Specifically, thepartial error circuitry 1307 can compare counts associated withdifferent values of the dither to derive partial errors at variousinspection points. Moreover, the error circuitry 1308 can combine thepartial errors appropriately to expose an error associated with acomponent of a circuit (e.g., shape/pattern associated withnon-linearities or linear gain errors) to form the error estimate. Thecalibration circuitry 1310 can update a LMS equation to converge on anestimate of a component of a circuit that can reduce the error estimateand/or drive the error estimate to zero. Calibration circuitry 1310 candrive the error estimate to/towards zero, e.g., by modifying the outputof the circuit in the analog domain or the digital domain based on theestimate of the component of the circuit and optionally a model for thecomponent of the circuit. When using a corrected output for subsequenterror estimation and calibration updates, the calibration circuitry 1310can enable the calibration (e.g., the LMS equation updates) to convergetowards a value for the estimate of the component of the circuit thatcan best reduce the error. Signal path 1312 illustrates calibration inthe analog domain to tune the circuit 1302. Signal path 1314 andcorrection component 1316 illustrate digital correction on the digitaloutput from ADC 1304. Note that a corrected output is used as input tothe counting circuitry 1306 for closed-loop calibration.

In some alternative implementations, the dither is removed in thedigital domain (downstream from ADC 1304).

The digital backend (e.g., 1306, 1307, 1308, 1310, and 1314, andpossibly the subtractor 106, depending on the implementation) can beimplemented with dedicated/specialized digital circuitry and/or an(on-chip) microprocessor programmable to carry out the calibrationfunctionalities herein.

In Example 2, the calibration system of Example 1, can optionallyinclude the dither being a signal having a plurality of values randomlydistributed between a plurality of values.

In Example 3, the calibration system of Example 1 or 2 can optionallyinclude the circuit comprising one or more of the following: a buffer, atrack and hold circuit, and an amplifier (including a multiplyingdigital-to-analog converter amplifier).

In Example 4, the calibration system of any one of Examples 1-3 canoptionally include the inspection points comprising one or more of thefollowing: a positive value, a positive dither value, a negative value,a negative dither value, and zero.

In Example 5, the calibration system of any one of Examples 1-4 canoptionally include the ranges defined by one or more inspection pointsincluding one or more of the following: a range of outputs below a firstinspection point, and a range of outputs above a second inspectionpoint.

In Example 6, the calibration system of any one of Examples 1-5 canoptionally include the inspection points changing randomly toaccommodate different input conditions.

In Example 7, the calibration system of any one of Examples 1-5 canoptionally include the inspection points changing based on one or moreconditions of the input of the circuit.

In Example 8, the calibration system of any one of Examples 1-7 canoptionally include the error circuitry comprising subtraction circuitryto subtract counts between different values of the dither to form apartial error estimate at a given inspection point.

In Example 9, the calibration system of any one of Examples 1-9 canoptionally include the error circuitry being configured to determine theerror estimate by adding partial errors determined at two differentinspection points.

In Example 10, the calibration system of any one of Examples 1-9 canoptionally include the error circuitry being configured to determine theerror estimate by subtracting partial errors determined at two differentinspection points.

In Example 11, the calibration system of any one of Examples 1-10 canoptionally include the calibration circuitry updating an estimate for acomponent of the circuit (non-linearity, gain, etc.) based on the errorestimate and a least means squared update equation.

In Example 12, the calibration system of any one of Examples 11 canoptionally include the calibration circuitry correcting the output ofthe circuit based on the estimate for the component of the circuit.

FIG. 14 is a flow diagram illustrating a method for calibrating acircuit, according to some embodiments of the disclosure. Example 101 isa method for (background) calibration of a circuit, comprising: adding adither at an input of the circuit and subtracting the dither at anoutput of the circuit (1402); accumulating counts of an output withinranges defined by one or more inspection points of the output (1404);comparing counts associated with different values of the dither (1406);determining an error estimate (1408); and driving the error estimate tozero (1410).

In Example 102, the method of Example 101 can optionally include drivingthe error to zero comprising updating an estimate of a component of thecircuit based on the error estimate (e.g., LMS equation), and correctingan output (a digital output) of the circuit based on the estimate.

In Example 103, the method of Example 102 can optionally include drivingthe error to zero further comprises updating the estimate of thecomponent of the circuit based on a parameter that enhances evensymmetrical errors while attenuating odd symmetrical errors.

In Example 104, the method of Example 102 can optionally include drivingthe error to zero further comprises updating the estimate of thecomponent of the circuit based on a parameter that enhances oddsymmetrical errors while attenuating even symmetrical errors.

In Example 105, the method of any one of Examples 101-104 can optionallyinclude the dither being a signal having a plurality of values randomlydistributed between a plurality of values.

In Example 106, the method of any one of Examples 101-105 can optionallyinclude the circuit comprising one or more of the following: a buffer, atrack and hold circuit, an amplifier, and a multiplyingdigital-to-analog converter.

In Example 107, the method of any one of Examples 101-106 can optionallyinclude the inspection points comprising one or more of the following: apositive value, a positive dither value, a negative value, a negativedither value, and zero.

In Example 108, the method of any one of Examples 101-107 can optionallyinclude the ranges defined by one or more inspection points includingone or more of the following: a range of outputs below a firstinspection point, a range of outputs above a second inspection point.

In Example 109, the method of any one of Examples 101-108 can optionallyinclude changing the inspection points randomly to accommodate differentinput conditions.

In Example 110, the method of any one of Examples 101-109 can optionallyinclude changing the inspection points based on one or more conditionsof the input of the circuit.

In Example 111, the method of any one of Examples 101-110 can optionallyinclude subtracting counts between different values of the dither toform a partial error estimate at a given inspection point.

In Example 112, the method of any one of Examples 101-113 can optionallyinclude determining the error estimate by adding partial errorsdetermined at two different inspection points.

In Example 113, the method of any one of Examples 101-114 can optionallyinclude determining the error estimate by subtracting partial errorsdetermined at two different inspection points.

Example A is an apparatus comprising means for implementing/carrying outany one of the methods described herein.

Example B is an apparatus for estimating errors and calibrating acircuit, comprising: means injecting a dither at an input of a circuitand removing the dither at the output of the circuit; means forevaluating counts of the output of the circuit associated with differentvalues of the dither within ranges defined by one or more inspectionpoints; means for combining the counts associated with different valuesof the dither to expose an error associated with a component of thecircuit; and means for updating an estimate of the component of thecircuit based on the error.

In Example C, the apparatus of Example B can optionally include themeans for evaluating counts of the output of the circuit comprisingcounting the output of the circuit falling within the ranges defined bythe inspection points.

In Example D, the apparatus of Example B or C can optionally includemeans for digitally correcting the output of the circuit based on theestimate and a model for the component of the circuit.

As discussed previously, cumulative histograms can be implementedefficiently in hardware by performing counting incrementally, orsample-by sample. FIG. 15 illustrates another calibration system,according to some embodiments of the disclosure. FIG. 15 is similar toFIG. 13, with the exception that the counting and comparingfunctionalities are replaced by efficient digital operations or digitalhardware that can perform counting and comparing incrementally, orsample-by-sample. The incremental or sample-by-sample counting andcomparisons is a special case or implementation of the histogramtechnique. Instead of counting over a block of data and comparingcounts/histograms for different dither values, operation 1502 can checkwhether the corrected output is within a range defined by an inspectionpoint. Operation 1502 can implement hit_(<x)(y) or hit_(>x)(y),depending on the range defined by the inspection point for a givenpartial error. Operation 1504 that implements sign(.) can check the signof the dither. An “AND” operation 1506 can combine the outputs ofoperation 1502 and 1506 to effectively implement comparison by assigningthe sign of the dither value to a hit (as previously illustrated byequations (52) and (53)). The result from the “AND” operation 1506 canform a partial error at a given inspection point. Error circuitry 1508can then combine partial errors at different inspection points to exposean error associated with a component of a circuit (e.g., shape/patternassociated with non-linearities or linear gain errors) to form the errorestimate. The error estimate can be used by calibration circuitry 1310to update the estimate for a component of the circuit 1302.

FIG. 16 illustrates yet another calibration system, according to someembodiments of the disclosure. The calibration system can implementcumulative histograms efficiently in hardware by performing countingincrementally, or sample-by sample. Specifically the calibration systemis designed for gain estimation at a zero inspection point. FIG. 16 issimilar to FIG. 15, with the exception that operation 1502 is replacedby operation 1602 implementing pos?(.) and neg?(.) operation as aspecial case to efficiently compute partial errors at a zero inspectionpoint (as previously illustrated in equations (54) and (55)).

FIG. 17 illustrates yet another calibration system, according to someembodiments of the disclosure. The calibration system can implementcumulative histograms efficiently in hardware by performing countingincrementally, or sample-by sample. Specifically the calibration systemis designed for gain estimation at a zero inspection point. FIG. 17 issimilar to FIG. 16, but with a further simplification as a special caseto efficiently compute partial errors and obtain the error estimate at azero inspection point (as previously illustrated by equation (56)).Operation 1702 can check the sign of the output with the dither removed.The result from operation 1702 and the result from operation 1504 can becombined by an “AND” operation 1704 to form the error estimate at thezero inspection point.

FIG. 18 is a flow diagram illustrating a method for calibrating acircuit, according to some embodiments of the disclosure. Example 21 isa method for efficient error estimation and calibration of a circuit,comprising: adding a dither at an input of the circuit (1802); removingthe dither at an output of the circuit (1804); updating an estimate of acomponent of a circuit on a sample-by-sample basis based on a sign bitof the dither and ranges on the output defined by one or more inspectionpoints (1806); and calibrating the circuit based on the estimate of thecomponent of the circuit (1808).

In Example 22, the method of Example 21 can optionally include updatingthe estimate of the component of the circuit comprising: setting a firstpartial error to be the sign bit of the dither if a given sample iswithin a first range on the output defined by a first inspection point;and setting a second partial error to be the sign bit of the dither ifthe given sample is within a second range on the output defined by asecond inspection point for a second partial error.

In Example 23, the method of Example 22 can optionally include updatingthe estimate of the component of the circuit further comprising:determining an error estimate based on the first and second partialerrors; and updating the estimate of a component of the circuit based onthe error estimate.

In Example 24, the method of Example 23 can optionally include updatingthe estimate of the component of the circuit comprising: setting thefirst partial error to be zero if the given sample is not with a firstrange defined by a first inspection point; and setting a second partialerror to be zero if the given sample not with within a second rangedefined by a second inspection point for a second partial error.

In Example 25, the method of any one of Examples 22-24 can optionallyinclude the first inspection point being a positive inspection point,and the second inspection point being a negative inspection point.

In Example 26, the method of any one of Examples 22-24 can optionallyinclude the first inspection point and the second inspection point beingthe same; and the first range does not overlap with the second range.

In Example 27, the method of any one of Examples 21-26 can optionallyinclude, wherein updating the estimate of the component of the circuitcomprises: setting an error estimate based on a sign bit of the ditherand a sign bit of the output, and updating the estimate of a componentof the circuit based on the error estimate.

Variations and Implementations

Note that the activities discussed above with reference to the FIGURESare applicable to any integrated circuits that involve processing analogsignals and converting the analog signals into digital data using one ormore ADCs. The features can be particularly beneficial to high speedADCs, where input frequencies are relatively high in the giga-Hertzrange. The ADC can be applicable to medical systems, scientificinstrumentation, wireless and wired communications systems (especiallysystems requiring a high sampling rate), radar, industrial processcontrol, audio and video equipment, instrumentation, and other systemswhich uses ADCs. The level of performance offered by high speed ADCs canbe particularly beneficial to products and systems in demanding marketssuch as high speed communications, medical imaging, synthetic apertureradar, digital beam-forming communication systems, broadbandcommunication systems, high performance imaging, and advancedtest/measurement systems (oscilloscopes).

The present disclosure encompasses apparatuses which can perform thevarious methods described herein. Such apparatuses can include circuitryillustrated by the FIGURES and described herein. Parts of variousapparatuses can include electronic circuitry to perform the functionsdescribed herein. The circuitry can operate in analog domain, digitaldomain, or in a mixed-signal domain. In some cases, one or more parts ofthe apparatus can be provided by a processor specially configured forcarrying out the functions described herein (e.g., control-relatedfunctions, timing-related functions). In some cases that processor canbe an on-chip processor with the ADC. The processor may include one ormore application specific components, or may include programmable logicgates which are configured to carry out the functions describe herein.In some instances, the processor may be configured to carrying out thefunctions described herein by executing one or more instructions storedon one or more non-transitory computer media.

In another example embodiment, the components of the FIGURES may beimplemented as stand-alone modules (e.g., a device with associatedcomponents and circuitry configured to perform a specific application orfunction) or implemented as plug-in modules into application specifichardware of electronic devices. Note that particular embodiments of thepresent disclosure may be readily included in a system on-chip (SOC)package, either in part, or in whole. An SOC represents an IC thatintegrates components of a computer or other electronic system into asingle chip. It may contain digital, analog, mixed-signal, and oftenradio frequency functions: all of which may be provided on a single chipsubstrate. Other embodiments may include a multi-chip-module (MCM), witha plurality of separate ICs located within a single electronic packageand configured to interact closely with each other through theelectronic package. In various other embodiments, the error calibrationfunctionalities may be implemented in one or more silicon cores inApplication Specific Integrated Circuits (ASICs), Field ProgrammableGate Arrays (FPGAs), and other semiconductor chips.

It is also imperative to note that all of the specifications,dimensions, and relationships outlined herein (e.g., the number ofprocessors, logic operations, etc.) have only been offered for purposesof example and teaching only. Such information may be variedconsiderably without departing from the spirit of the presentdisclosure, or the scope of the appended claims (if any) or examplesdescribed herein. The specifications apply only to one non-limitingexample and, accordingly, they should be construed as such. In theforegoing description, example embodiments have been described withreference to particular processor and/or component arrangements. Variousmodifications and changes may be made to such embodiments withoutdeparting from the scope of the appended claims (if any) or examplesdescribed herein. The description and drawings are, accordingly, to beregarded in an illustrative rather than in a restrictive sense.

Note that with the numerous examples provided herein, interaction may bedescribed in terms of two, three, four, or more electrical components orparts. However, this has been done for purposes of clarity and exampleonly. It should be appreciated that the system can be consolidated inany suitable manner. Along similar design alternatives, any of theillustrated components, modules, blocks, and elements of the FIGURES maybe combined in various possible configurations, all of which are clearlywithin the broad scope of this Specification. In certain cases, it maybe easier to describe one or more of the functionalities of a given setof flows by only referencing a limited number of electrical elements. Itshould be appreciated that the electrical circuits of the FIGURES andits teachings are readily scalable and can accommodate a large number ofcomponents, as well as more complicated/sophisticated arrangements andconfigurations. Accordingly, the examples provided should not limit thescope or inhibit the broad teachings of the electrical circuits aspotentially applied to a myriad of other architectures.

Note that in this Specification, references to various features (e.g.,elements, structures, modules, components, steps, operations,characteristics, etc.) included in “one embodiment”, “exampleembodiment”, “an embodiment”, “another embodiment”, “some embodiments”,“various embodiments”, “other embodiments”, “alternative embodiment”,and the like are intended to mean that any such features are included inone or more embodiments of the present disclosure, but may, or may notnecessarily be combined in the same embodiments. It is also important tonote that the functions described herein illustrate only some of thepossible functions that may be executed by, or within, systems/circuitsillustrated in the FIGURES. Some of these operations may be deleted orremoved where appropriate, or these operations may be modified orchanged considerably without departing from the scope of the presentdisclosure. In addition, the timing of these operations may be alteredconsiderably. The preceding operational flows have been offered forpurposes of example and discussion. Substantial flexibility is providedby embodiments described herein in that any suitable arrangements,chronologies, configurations, and timing mechanisms may be providedwithout departing from the teachings of the present disclosure. Numerousother changes, substitutions, variations, alterations, and modificationsmay be ascertained to one skilled in the art and it is intended that thepresent disclosure encompass all such changes, substitutions,variations, alterations, and modifications as falling within the scopeof the appended claims (if any) or examples described herein. Note thatall optional features of the apparatus described above may also beimplemented with respect to the method or process described herein andspecifics in the examples may be used anywhere in one or moreembodiments.

What is claimed is:
 1. A calibration system with efficient errorestimation, comprising: dither circuitry to inject a dither at an inputof a circuit and to remove the dither at an output of the circuit;counting circuitry to count a first number of samples of the outputcorresponding to a first value of the dither falling within a rangedefined by an inspection point of the output, and count a second numberof samples of the output corresponding to a second, different value ofthe dither falling within the range defined by the inspection point ofthe output; error circuitry to compare the first number and the secondnumber, and determine an error estimate based on the comparison; andcalibration circuitry to drive the error estimate towards zero.
 2. Thecalibration system of claim 1, wherein the dither is a signal having aplurality of values randomly distributed between the plurality ofvalues.
 3. The calibration system of claim 1, wherein the circuitcomprises one or more of the following: a buffer, a track and holdcircuit, and an amplifier.
 4. The calibration system of claim 1, whereinthe inspection point comprises one of the following: a positive value, apositive dither value, a negative value, a negative dither value, andzero.
 5. The calibration system of claim 1, wherein the range defined bythe inspection point includes one of the following: a range of outputsbelow a first inspection point, and a range of outputs above a secondinspection point.
 6. The calibration system of claim 1, wherein theinspection points changes randomly to accommodate different inputconditions.
 7. The calibration system of claim 1, wherein the inspectionpoints changes based on one or more conditions of the input of thecircuit.
 8. The calibration system of claim 1, wherein the errorcircuitry comprises: subtraction circuitry to subtract the first numberand the second number to form a partial error at the inspection point.9. The calibration system of claim 1, wherein the error circuitrydetermines the error estimate by adding partial errors determined at theinspection point and a different inspection point.
 10. The calibrationsystem of claim 1, wherein the error circuitry determines the errorestimate by subtracting partial errors determined at the inspectionpoint and a different inspection point.
 11. The calibration system ofclaim 1, wherein the calibration circuitry updates an estimate for acomponent of the circuit based on the error estimate and a least meanssquared update equation.
 12. The calibration system of claim 11, whereinthe calibration circuitry corrects the output of the circuit based onthe estimate for the component of the circuit.
 13. A method forefficient error estimation and calibration of a circuit, comprising:adding a dither at an input of the circuit; removing the dither at anoutput of the circuit; counting a first number of samples of the outputcorresponding to a first value of the dither falling within a rangedefined by an inspection point of the output, and counting a secondnumber of samples of the output corresponding to a second, differentvalue of the dither falling within the range defined by the inspectionpoint of the output; comparing the first number and the second number;determining an error estimate based on the comparison; and driving theerror estimate towards zero.
 14. The method of claim 13, wherein drivingthe error estimate towards zero comprises: updating an estimate of acomponent of the circuit based on the error estimate; and correcting adigital output of the circuit based on the estimate.
 15. The method ofclaim 14, wherein driving the error estimate to zero comprises: updatingthe estimate of the component of the circuit based on a parameter thatenhances even symmetrical errors while attenuating odd symmetricalerrors.
 16. The method of claim 14, wherein driving the error estimateto zero comprises: updating the estimate of the component of the circuitbased on a parameter that enhances odd symmetrical errors whileattenuating even symmetrical errors.
 17. The method of claim 13,wherein: the comparison forms a partial error estimate at the inspectionpoint; and determining the error estimate comprises combining partialerror estimates determined at the inspection points and a differentinspection point.
 18. An apparatus for estimating errors and calibratinga circuit, comprising: means for injecting a dither at an input of acircuit and removing the dither at an output of the circuit; means forevaluating a first count of the output of the circuit associated with afirst value of the dither falling within a ranges defined by aninspection point, and a second count of the output of the circuit of thecircuit associated with a second value of the dither falling within therange defined by the inspection point; means for combining the firstcount and the second count to expose an error associated with acomponent of the circuit; and means for updating an estimate of thecomponent of the circuit based on the error.
 19. The apparatus of claim18, wherein the means for evaluating the first count and the secondcount comprises means for counting a number of samples of the output ofthe circuit falling within the ranges defined by the inspection point.20. The apparatus of claim 18, further comprising: means for digitallycorrecting the output of the circuit based on the estimate of thecomponent and a model for the component of the circuit.